Experimental analysis of tip vibrations at higher eigenmodes of QPlus sensors for atomic force microscopy

- Ruppert, Michael G., Martin-Jimenez, Daniel, Yong, Yuen K., Ihle, Alexander, Schirmeisen, Andre, Fleming, Andrew J., Ebeling, Daniel

Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing

- Ruppert, Michael G., Moore, Steven I., Zawierta, Michal, Fleming, Andrew J., Putrino, Gino, Yong, Yuen K.

Bulk scale fabrication of sodium tungsten bronze nanoparticles for applications in plasmonics

- Tegg, Levi, Cuskelly, Dylan, Keast, Vicki J.

Optical properties and oxidation of alpha-phase Ag-Al thin films

- De Silva, Kaludewa S. B., Keast, Vicki J., Gentle, Angus, Cortie, Michael B.

Ba termination of Ge(001) studied with STM

- Koczorowski, W., Grzela, T., Radny, M. W., Schofield, S. R., Capellini, G., Czajka, R., Schroeder, T., Curson, N. J.

Scanning transmission x-ray microscopy of polymer nanoparticles: probing morphology on sub-10nm length scales

- Burke, Kerry B., Stapleton, Andrew J., Vaughan, Ben, Zhou, Xiaojing, Kilcoyne, A. L. David, Belcher, Warwick J., Dastoor, Paul C.

High-speed cycloid-scan atomic force microscopy

- Yong, Y. K., Moheimani, S. O. R., Petersen, I. R.

Fast spiral-scan atomic force microscopy

- Mahmood, I. A., Moheimani, S. O. Reza

Evolution of the nanomorphology of photovoltaic polyfluorene blends: sub-100 nm resolution with x-ray spectromicroscopy

- McNeill, C. R., Watts, B., Swaraj, S., Ade, H., Thomsen, L., Belcher, W. J., Dastoor, P. C.

High-bandwidth control of a piezoelectric nanopositioning stage in the presence of plant uncertainties

- Aphale, Sumeet S., Devasia, Santosh, Moheimani, S. O.